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High-power RF signal generators have the edge
In RF testing, an essential attribute of every signal generator is the maximum output power it can supply to a device under test (DUT) while maintaining spectral purity and level accuracy.
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Adding value to arbitrary generators
During the design and production of electronic products, complex circuitry or subsystems need to be tested and often require additional signals from a missing or difficult-to-obtain component or sensor.
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Antritsu MG3690C series RF/microwave signal generators
The MG3690C series of RF/microwave signal generators is claimed to be best-in-class for phase noise and broad frequency generation, allowing users to carry out accurate tests on subsystems, especially those in local oscillator substitution and clock-generation applications.
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Anritsu MG3690C series RF/microwave signal generators
The MG3690C series of RF/microwave signal generators combines best-in-class phase noise and broad frequency generation to allow engineers to conduct highly accurate tests on subsystems, especially those in local oscillator substitution and clock generation applications.
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RF sweep generator
The Agilent 83623B is a high-resolution, high-power swept signal source suitable for applications requiring the high performance and accuracy of a synthesised source and the speed and versatility of a sweep oscillator.
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Agilent analog signal generator
Agilent has available a compact microwave analog signal generator that is an extension to the MXG generator platform, providing frequency coverage to 20, 32 or 40 GHz.
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Vector signal generator
The Rohde&Schwarz SMBV 100A vector signal generator is a standalone solution that claims unmatched flexibility.
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10 MHz function/arbitrary waveform generator
Agilent Technologies has available the function/arbitrary waveform family, instruments that generate the waveforms needed for bench and system applications.
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Waveform generator/fast measurement unit
Agilent Technologies has introduced a waveform generator/fast measurement unit (WGFMU) for its B1500A semiconductor device analyser that performs the high-speed measurements required to characterise ultra-fast negative bias temperature instability (NBTI) and other applications such as pulsed IV, random telegraph signal (RTS), new types of non-volatile resistive memory like PRAM/ReRAM.
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Measurement solutions for uplink and downlink signals
The R&S SMx-K55 3GPP LTE option for Rohde & Schwarz signal generators offers downlink and uplink functionalities. The SMU200A, SMJ100A and SMATE200A can generate high-quality 3GPP LTE signals for tests on components and receivers of base stations and mobile phones.
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